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"Thickness Measurement"...

Dave Wilson

Dave Wilson, Editor, writes:
 

We see from your search that you're looking for information on the term "Thickness Measurement", and we have a large number of manufacturers' news releases and technical articles here on Engineeringtalk which will be of interest. Let me be your guide.
 
Start with the news release Displacement sensor brochure released from PI (Physik Instrumente), which we summarised at the time by saying "PI (Physik Instrumente)'s brochure features a tutorial on single-plate and dual-plate capacitive sensors and an applications overview". A few weeks before, we featured the news release Ultrasonic flaw detector scans structures from GE Inspection Technologies: "The Phasor XS has brought phased array flaw-imaging capability to everyday inspection in an easy to use, portable and affordable ultrasonic instrument".
 
In February 2007, we covered the news from Micro-Epsilon UK concerning its optoNCDT 2402 sensors - take a look at Sensors fit into tight spaces which says: "Micro-Epsilon's miniature confocal displacement measurement sensors are suitable for measuring inside confined spaces such as narrow cavities, drilled holes and bores".
 
Take a look also at the news release from Delmia, Simulation tool aids robotic system development, as well as Ultrasonic flaw detector reduces inspection times from GE Inspection Technologies, and Added benefits for portable flaw detector from GE Inspection Technologies.
 

See also:

Wall thickness gauge from CV (July 2006)
CV Instruments has launched a new digital wall thickness gauge, capable of wall thickness measurement of up to 10mm

Intelligent sensors advance thickness measurement (June 2006)
Total distributed intelligence is heralded as the next step forward in the evolution of online thickness measurement and control systems

Measurement software expands hardware support (May 2006)
Camio 4.3 is the first release of the metrology software suite since Metris acquired LK in January and its release is significant in highlighting the rapid integration of the two metrology companies

Website focuses on applications (March 2006)
The Micro-Epsilon website has a new application-focused structure that makes it easier for engineers to locate the sensor or measurement solution they require

Sensor brochure for food industry (December 2005)
Balluff introduces brochure on sensors for the food and packaging industry

Confocal chromatic sensor shines at its task (February 2005)
A novel displacement sensor measures independently from surface reflection using a unique 'confocal chromatic' measurement principle

Thickness measurement is all a question of timing (February 2005)
Micro-Epsilon has developed a two-channel synchronous controller for accurate measurement of thickness in production and quality control environments

Measurement and control solutions on show at K (September 2004)
NDC Infrared Engineering's innovative and popular range of measurement and control solutions will be featured on stand A01 at K2004

Film thickness measurement system runs online (August 2004)
Lumetrics has successfully used its DI 330 Optigauge film thickness measurement system for online thickness measurement tests during the production of high-performance specialty film

Measurement system uses multiple sensor types (April 2003)
The GageMaster is a complete, easily reconfigurable multichannel system for measuring displacement, vibration, thickness, high-speed motion, spindle error motions and more

Cost-effective metal film thickness measurement (July 2002)
The Mesec is a new metal film metrology instrument for copper seed and electroplated copper layers on 200 or 300mm silicon wafers

Sensor profiles problem surfaces (July 2002)
Matsushita Electric Works has enhanced its range of measurement sensors by introducing the new SUNX HL-C1 laser measurement system

LED sensors are safer than lasers (April 2002)
The LH-50 Series of high precision measurement sensors is an LED based system that offers the same measurement performance as a Class 1 or 2 laser based system

Eddy current technology provides accurate sensors (February 2002)
Matsushita Electric Works has enhanced its range of measurement sensors by introducing the SUNX GP-A Series eddy current technology displacement sensor

Thickness measurement down to five microns or less (December 2001)
NDC Infrared Engineering has developed a new on-line thickness gauge which offers high performance thickness measurement down to five microns or less

Accurate measurements of even sub-micron films (August 2001)
NDC Infrared Engineering is launching a new on-line ultra thin film thickness gauge which uses new infrared technology to overcome the effects of optical fringe interference

On-line extrusion measuring gauge avoids sampling (March 2001)
Scott and Fyfe of Tayport has cut costs by fitting an on-line measuring gauge for measurement and closed-loop control of film thickness to the extrusion line

The longer distance Laser Displacement Sensor (February 2000)
GWI Ltd announce the latest addition to their range of optical sensors, the Model LAS1010V Laser Displacement Sensor, which offers position measurement without target contact in the range ± 200mm

 

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