Form/co-ordinate, optical, vision instruments

(a sub category of Monitoring, Measurement and Quality)

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Latest articles from 'Form/co-ordinate, optical, vision instruments'

News releases from this sub-category

Showing 376-400 of 766 articles

Endoscope gets to the point of inspection

A low-cost small-diameter industrial endoscope enables remote viewing of inaccessible structures where space is at a premium.

News from Moritex Europe, May 31, 2006

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Measurement device adds CAD-to-part analysis

Faro UK will demonstrate its new PowerGage at a free workshop to be held at Delcam's Birmingham headquarters on 6th June 2006.

News from Delcam, May 30, 2006

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Inspection software masters geometry

Delcam will demonstrate three new versions of its PowerInspect inspection software at the Quality Expo to be held in Novi, Michigan, on 7th and 8th June 2006.

News from Delcam, May 29, 2006

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Time and throughput to the fore in Poland

Renishaw is focusing on time and throughput issues at Machtool 2006, being held in Poznan, Poland, from 19th to 22nd June 2006.

News from Renishaw, May 26, 2006

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DROs promise quality at a competitive price

A new to market range of DRO digital readout systems equipment is now available from Jade Products Rugby.

News from Jade Products Rugby, May 26, 2006

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Camera captures microscope images

The new Olympus DP71 digital camera offers unmatched versatility for microscopists, combining highest sensitivity with market-leading image acquisition rates and colour match performance.

News from Olympus Industrial, May 25, 2006

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Upgrade for handheld video capture device

The PalmScope PS-103 handheld video capture device includes as standard audio record/playback and offer options for a DVI output, a USB 2.0 interface and support for 4Gbyte CompactFlash cards.

News from Moritex Europe, May 23, 2006

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Nanopositioning controller comes into focus

A new high-speed nano-focusing system promises a tenfold increase in focusing speed.

News from Lambda Photometrics, May 15, 2006

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Xenon flash lamps help capture transient events

A new generation of multiheaded xenon flash lamps is specifically designed and optimised for use with ultrafast cameras that have short recording times.

News from Specialised Imaging, May 15, 2006

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Stereo microscopes promise distortion-free images

Olympus has launched the revolutionary new SZX2 series of stereo microscopes.

News from Olympus Industrial, May 12, 2006

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CMM raises accuracy and throughput

The Libero is a high-performance CMM aimed at the high-accuracy high-throughput market dominated by the automotive and aerospace industries.

News from Metris, May 10, 2006

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Scanning systems speed measurement throughput

Renishaw is focusing on measurement time and throughput issues at Control 2006, with a range of revolutionary new five-axis scanning systems for co-ordinate measuring machines.

News from Renishaw, May 8, 2006

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Precision flats get the measure of surfaces

Optical Surfaces offers a range of standard and custom precision flats up to 600mm in diameter manufactured of high-stability materials such as glass, Zerodur and silica.

News from Optical Surfaces, May 3, 2006

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Handheld scanner uses digital camera technology

ModelMaker D is billed as the latest in handheld laser scanning, featuring true digital camera technology to significantly increase system performance and productivity.

News from Metris, May 2, 2006

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Video check for cars at roadside

Device combines video endoscope technology with video capture and storage system to provide easy-to-use tool for roadside spot checks of brakes, HGV regulation violations and accident inspections.

News from Moritex Europe, May 1, 2006

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Beam splitter provides maximum optical power

Tech Spec high-energy polarising cube beamsplitters use multilayer dielectric film technology to minimise reflection and absorption losses.

News from Edmund Optics, Apr 28, 2006

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Growth strategy garners Frost and Sullivan award

Metris has won the 2006 Frost and Sullivan Growth Strategy Leadership of the Year Award for its strategies towards growth and contribution to the dimensional metrology industry.

News from Metris, Apr 24, 2006

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Quality gauging tips have lasting value

A selection of Modern Machine Shop's popular "Quality gaging tips" columns has been released in book form by Hanser Gardner Publications.

News from Mahr Federal, Apr 24, 2006

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Package deal cuts the cost of CMM upgrades

Deva Electronic Controls offer a highly successful range of CMM products for the manufacture and retrofit of both manual and automatic co-ordinate measuring machines.

News from Deva Electronic Controls, Apr 24, 2006

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Manual control or remote operation of light source

Halogen 100 and 150W light sources are CE marked and use proprietary operating cycle to provide a stable output at a higher colour temperature and over a longer life than incandescent bulbs.

News from Moritex Europe, Apr 20, 2006

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Acquisition expands measurement portfolio

With the acquisition of Helios, the Mahr Group has enhanced its existing product range in horizontal length measurement with the brands SIP and Helios.

News from Mahr Federal, Apr 20, 2006

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System keeps track of projectile trajectory

A system provides consistent and accurate tracking of projectiles in flight using a computer controlled triggered rotating mirror positioned in front of a high-speed digital video camera.

News from Specialised Imaging, Apr 14, 2006

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Diamond turning explained online

Precision-Optical Engineering has published the latest in its series of technical datasheets on diamond turning in the technical library section of its website.

News from Precision-Optical Engineering, Apr 13, 2006

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Vision association helps out production manager

Vision association flies to the rescue of distraught production manager who needed spare parts for US vision system.

News from UK Industrial Vision Association, Apr 12, 2006

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Optical pens show their versatility

Modular design of confocal chromatic optical pens allows up to 30 configurations for specific depth of field, spot size, working distance, object slope and photometric efficiency.

News from Micro Photonics, Mar 30, 2006

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