Adept unveils Dalsa dual-line scan CCD
An
Adept Electronic Solutions product story
Edited by the Engineeringtalk editorial team
Dec 19, 2008
Adept Electronic Solutions has introduced Dalsa dual-line scan architecture that doubles image sensor responsivity without shot noise penalty.
Dalsa's dual-line scan CCD doubles sensitivity with only an andradic 2 increase in shot noise, delivering a greater signal-to-noise ratio, especially in light-starved situations.
Dalsa dual-line scan CCD
Functionally similar to TDI arrays, the design consists of two parallel arrays of photodiode pixels.
Each pixel is connected to a selectable delay gate that either allows charges through or delays the charges by one scan line.
Signal electrons from the two arrays (one of which has been delayed) are then combined on-chip into a single output (with no increase in amplifier noise).
Because the delay is selectable, the sensor allows bidirectional scanning.
The design also preserves powerful conventional line scan features, such as exposure control and high-blue response.
The main disadvantage of this design is an increase in dark signal from the doubled pixel area.
But for high-speed applications (as most line scan applications are), the integration time is so short that the dark signal remains negligible.
Proof of the design's high-speed low-light effectiveness can be found in Dalsa's Spyder3 GigE line scan camera.
With dual-line scan and improved CCE, it delivers three times the responsivity and twice the line rates of its predecessor.
This camera also offers a gigabit Ethernet interface, which allows 100m cable lengths (longer with repeaters) and can significantly reduce total system costs.
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