CMOS image sensors provide versatile solution
An
Alrad Instruments product story
Edited by the Engineeringtalk editorial team
Jul 18, 2008
The DLIS-2K and 4K sensors consist of four independently selectable and resettable rows with 2080 or 4096 optical each and a high-resolution mode of 4160 or 8192 pixels, respectively.
Panavision Imaging has released the DLIS-2K and the DLIS-4K re-configurable line scan CMOS image sensors for a range of applications.
The sensors feature oversampling for enhanced sensitivity and high dynamic range (HDR) imaging.
The DLIS-2K and 4K sensors consist of four independently selectable and resettable rows with 2080 or 4096 optical each and a high-resolution mode of 4160 or 8192 pixels, respectively.
Three rows feature four micron square pixels and the fourth row features 4 micron wide x 32 micron tall pixels.
Row integration time can be controlled either by direct external control or internal programmable control via a three-wire serial interface.
The distributed analogue to digital convertor (D/AD) per pixel has selectable resolution of 7 to 11bit and a one bit output using a selectable threshold.
The DLIS-2K and 4K operates from a single power supply of 3.3V and is offered in a 40 and 44-pin LCC package respectively.
The DLIS-2K and 4K are user configurable to satisfy a wide range of demanding applications.
The DLIS-2K and 4K can output full single row data at 13000 frames a second or 8000 frames a second at 8bit respectively, for higher speed applications.
An automatic dynamic threshold (ADT) with a binary output provides an integrated and cost reducing solution for bar code and positioning applications.
Readout modes include: correlated double sampling (CDS), ambient light subtraction, oversampling, nondestructive read, binning of different integrations, binning of different rows and a high-resolution mode.
The high-resolution mode of 4000 and 8000 pixels for the DLIS-2K and 4K respectively, is provided by reading two rows of four micron pixels, offset by two microns.
Both imagers have programmable gain and offset (2bit control), onboard test mode capabilities, including external input to the A/D for calibration or other external analogue input that needs to be digitised.
The imagers have up to 11bit internal and up to 10bit data output, power down mode and the data pins have tri-state outputs for multiple imagers on one data bus.
Engineering samples with a demonstration kit are now available.
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