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Alrad unveils Panavision CMOS image sensors

An Alrad Instruments product story
Edited by the Engineeringtalk editorial team Aug 24, 2009

Alrad Imaging has introduced high-performance, low-cost image sensors manufactured by Panavision Imaging.

The DLIS-2K reconfigurable line-scan CMOS image sensors are claimed to combine high sensitivity, high speed and versatility to address many applications and markets, including scientific, automotive and consumer.

They can be used in spectroscopy, barcode, touch-screen, OCR, machine-vision and measurement applications.

The DLIS-2K image sensors feature oversampling for enhanced sensitivity and high-dynamic-range imaging.

Each sensor consists of four independently selectable and resettable rows with 2,080 optical elements and a high-resolution mode of 4,160 pixels.

Three rows feature four-micron square pixels and the fourth row features four-micron-wide x 32-micron-tall pixels.

The 4 x 32 micron pixel has sensitivity exceeding 100V/Lux/S.

Row integration time can be controlled either by direct external control or internal programmable control via a three-wire serial interface.

The distributed analogue-to-digital converter per pixel has selectable resolution of 7-11 bits and a 1-bit output using a selectable threshold.

The user-configurable DLIS-2K operates from a single power supply of 3.3V and is offered in a 40-pin LCC package.

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