Cost-effective solution for surface profiling
An
Armstrong Optical product story
Edited by the Engineeringtalk editorial team
Dec 6, 2004
The MicroMesure II system features new and upgraded functionality.
Following the successful adoption by a number of UK facilities of the MicroMesure system for 3D noncontact surface profiling, Armstrong Optical has released the MicroMesure II system with new and upgraded functionality.
The MicroMesure systems are produced by Stil of Aix-en-Provence in France - the first company to commercialise extended field confocal scanning optical microscopy for the analysis of surfaces.
In order to make the changeover from one sensor to another simple and automatic, an optional mechanical turret system is now available.
This allows up to four sensors, two cameras or complimentary third-party sensors to be utilised during a profiling run without user interaction.
The addition of optical encoders on the x and y scanning axes brings two advantages.
First, higher positional accuracy is ensured during scanning, and secondly scanning is made faster as data acquisition now occurs during both directions of scanning.
The SurfaceMap system control software has also been upgraded to include a rapid prescan and automatic surface search functions - ensuring that surfaces are profiled under optimum conditions.
Many other features now available on the MicroMesure II have been included to meet user requirements ensuring that the system provides the most cost-effective solution to a wide range of surface profiling needs.
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