Optical pens feature modular design
An
Armstrong Optical product story
Edited by the Engineeringtalk editorial team
Aug 17, 2006
Confocal chromatic optical pens aid profilometry, microtopography, roughness, autofocus vibrometry, inline inspection quality control and thickness measurements.
Armstrong Optical has introduced its latest line of confocal chromatic optical pens (manufactured by Stil of Aix-en-Provence) for profilometry, microtopography, roughness, autofocus vibrometry, inline inspection quality control and thickness measurements.
The new modular design allows up to 30 different optical pen configurations for specific depth of field, spot size, working distance, object slope and photometric efficiency.
Users can choose from a selection of five magnifiers ranging from 3.3 to 29mm focal lengths and six different chromatic lenses with 130um to 27mm depth of fields.
Pens can achieve maximum axial resolution of 5nm, accuracy to 20nm and maximum slope to 87 degrees for diffusive objects.
Based on white-light chromatic aberration, the pens have superior lateral resolution (1.1um) and vertical resolution (5nm), making them a better choice than laser triangulation sensors for applications where high-resolution measurements are critical, as sometimes found in vibrometry, inline inspection and quality control applications.
For challenging materials such as textiles, polymers, black or dark blue materials, high aspect ratio surfaces and materials of low reflectivity, white-light chromatic aberration is often the only appropriate technique.
Armstrong Optical believes that its new competitive pricing will attract clients who previously considered white-light chromatic aberration too expensive.
"Clients have known of this technique, and its benefits for OEM applications, but because of the price it was passed on in favour of cheaper laser sensors".
"The new prices are 40% lower on average, which should make all the difference", said Ian Johnstone.
Acquisition speed to 30,000Hz meets specific vibrometry, inline and offline quality control requirements.
The system can be used as a stand-alone unit or connected to a computer using various software packages.
Integrated solutions such as the MicroMesure profiler and MicroMesure dual scanner are also available for complete 3D surface imaging.
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