Near-infra-red analyser is speedy scanner

Edited by the Engineeringtalk editorial team Nov 7, 2006

Novel near-infra-red analyser achieves an impressive spectral range of 1375-2750nm and an ultra fast scan speed of 100scan/s for real-time process monitoring.

Aspectrics has launched a new encoded photometric near infra-red (EP-NIR) analyser.

This novel near-infra-red MultiComponent 2750 analyser achieves an impressive spectral range of 1375-2750nm and an ultra fast scan speed of 100scan/s.

Designed to enable users in the process industry to monitor their processes in real time, Aspectrics EP-NIR analyser will be showcased on Booth 4417 at Pittcon 2007, McCormick Place, Chicago, Illinois, from 25th February to 2nd March 2007.

Also being displayed on Booth 4417 will be Aspectrics' award-winning EP-IR analysers.

Recently presented with the R and D Top 100 Award, Aspectrics EP-IR MultiComponent analyser has been recognised as one of the top 100 most technologically significant products introduced into the marketplace in 2006.

The EP-IR MultiComponent analyser was noted at the awards for its impressive spectral range, its 128 photometric channels and the fast scan rate of 100scan/s.

Additionally, Aspectrics innovative analysers include a standard suite of software solutions, resulting in quicker and more efficient real-time data acquisition, as well as instrument control, data play back and quantitation.

Moreover, Aspectrics innovative EP-IR analysers have recently achieved military 202G Method 204D certification for successfully passing the high frequency resistance test.

The test was performed to determine the effect of vibration on component parts of the analysers in frequency ranges of 0.5 to 30Hz.

The units demonstrated no degradation in performance during or after the test compared with traditional Fourier transform infra-red (FT-IR) systems.