Near infra-red process analyser displayed
An
Aspectrics product story
Edited by the Engineeringtalk editorial team
Feb 27, 2007
Aspectrics' EP-NIR analyser offers a breakthrough in NIR analysis, facilitating ultra-fast scanning operation capable of acquiring an impressive 100 scans/s.
Aspectrics, has relesaed an encoded photometric near infra-red (EP-NIR) process analyser which will be displayed on the Aspectrics booth #4417 at Pittcon 2007, McCormick Place, Chicago, Illinois, 26 February to 1 March, 2007.
Whereas traditional NIR systems typically stop at 2100nm, the MultiComponent 2750 analyser covers an unprecedented spectral range of 1375-2750nm, allowing users access to information rich combination bands between 1950nm and 2750nm.
This unique capability makes the new analyser perfectly suitable for a wide range of applications including: biodiesel, edible oils, end point drying, protein/fat analysis, petrochemicals, and alcohols/starch.
Aspectrics' EP-NIR analyser offers a breakthrough in NIR analysis, facilitating ultra-fast scanning operation capable of acquiring an impressive 100 scans/s, resulting in high sample throughput, real-time quality control monitoring and extreme sensitivity through spectral averaging.
Combining ultra-fast operation with rugged design, the analyser incorporates a pre-aligned and pre-indexed process optical design ideally suited to meet the requirements of the demanding process environment.
The proprietary EP-NIR technology has also recently achieved Military 202G Method 204D certification for successfully passing the high frequency vibration resistance test.
Jim Yano, VP of Marketing comments, "Featuring software options from Aspectrics, the novel EP-NIR will result in a complete real-time process analyser solution that will enable our customers to achieve faster and more reliable analyses".
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