Product category:
Simulation, modelling and validation software
News Release from: Beasy
Edited by the Engineeringtalk Editorial
Team on 06 October 2006
Virtual testing in fatigue life
evaluation
Beasy will be attending the National Conference on Failure Analysis 2006 in Hyderabad, India, from 20th to 23rd December 2006.
Beasy will be attending the National Conference on Failure Analysis 2006 in Hyderabad, India, from 20th to 23rd December 2006 The theme of failure analysis is important to aerospace, automobile, defence, engineering, chemical, petrochemical and power generation industries
This article was originally published on Engineeringtalk on 12 Oct 2006 at 8.00am (UK)
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The cause as well as prevention of failures has drawn considerable attention worldwide.
The purpose of the conference is to bring together the multidisciplinary community of designers, researchers, users and regulatory bodies to discuss the causes of failures and prevention methods.
The programme will consist of presentations by invited eminent engineers and operators, including a paper written by Beasy integrity expert Dr Sharon Mellings and Dr Mahesh of Advanced Metal Forming Technology Centre entitled "Virtual structural testing using fatigue crack growth simulation".
This paper presents the results of a study to investigate the role of virtual testing in fatigue life evaluation.
The tests were aimed to identify both the life of the product and the mode of failure.
Multiple cracks were initiated into a component and experimental observations of the fatigue crack growth were compared with computational simulations made with the crack growth code Beasy.
The methodology behind the simulation and the tests will be presented as well as results obtained.
The simulation technology was further tested by applying to a large scale structure consisting of a number of panels stiffened by ribs and stringers.
Virtual testing of the structure was performed to predict the structural failure due to crack growth and the estimated fatigue life of the structure.
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