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Infra-red detectors go on show

A Cedip Infrared Systems product story
Edited by the Engineeringtalk editorial team Apr 17, 2003

The latest products from Cedip Infrared Systems will be shown at a number of important European exhibitions this summer.

The latest products from Cedip Infrared Systems will be shown at a number of important European exhibitions this summer.

At Laser 2003 (23rd-26th June), Cedip will showcase on stand 174 (Hall B2) the Jade SWIR, a new camera designed to meet the demanding infra-red analysis requirements of spectroscopic test equipment for telecomms and process monitoring applications.

The Jade SWIR camera is sensitive from 0.8 to 2.5um and uses an MCT based focal plane array sensor cooled with a thermoelectric cooler to provide extremely high sensitivity and hence to capture in real-time high-speed dynamic events in snapshot readout mode.

Coupled with Cedip's powerful, yet intuitive PC-based analysis and reporting software Altair, the system provides engineers with a cost effective solution for obtaining accurate thermal measurements in the most challenging test situations.

Also featuring prominently will be the Emerald, a new high-performance large- format (640 x 512pixel) IR camera.

The Emerald can operate up to 100 frames per second at full image size with output digitised over a complete 14bit dynamic range.

Capable of operating at 3-5um using InSb or HgCdTe focal plane arrays or 8-12um using quantum well focal plane arrays, the Emerald is a device well suited to a variety of applications including airborne imaging or long range surveillance.

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