Product category:
Vision and Colour Sensors
News Release from: Cedip Infrared Systems | Subject: Jade SWIR
Edited by the Engineeringtalk Editorial
Team on 13 May 2003
Short-wavelength IR reveals invisible
blemishes
In providing very clear and sensitive images in the short-wavelength infra-red spectrum, the Jade SWIR allows researchers to investigate phenomena that would remain unseen with visible cameras.
In providing very clear and sensitive images in the short-wavelength infra-red spectrum, the Jade SWIR from Cedip Infrared Systems allows researchers to investigate phenomena that would remain unseen with visible cameras, and at a reasonable cost The 0.8-2.5um wavelength gap addressed by the Jade SWIR allows the camera to see through paint coatings and then reveal hidden blemishes
This article was originally published on Engineeringtalk on 21 Dec 2007 at 8.00am (UK)
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Broader spectral response is particularly important for applications requiring high sensitivity at infra-red wavelengths out to 2.5um.
Consequently the Jade SWIR will provide aerospace, automotive and engineering researchers with a powerful and fast tool to investigate nonuniformly coated layers or defects in an underlying structure.
Using a thermoelectrically cooled MCT focal plane array sensor the Jade SWIR provides high sensitivity with an increasing response at the longer wavelengths.
By using selected narrow band optical filters, the Jade SWIR may be further fine tuned to provide optimised performance to the sub-band to be analysed.
Operating at up to 100 frames per second at full image size (320 x 256), with output digitised over a complete 14bit dynamic range the Jade SWIR provides the leading edge resolution to clarify even the smallest area of defect or nonuniformity.
Coupled with Cedip's powerful, yet intuitive PC-based analysis and reporting software the system provides users with a powerful and cost effective investigative tool. Request a free brochure from Cedip Infrared Systems ...
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