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Machine vision camera makes a hit in Paris

A Cedip Infrared Systems product story
Edited by the Engineeringtalk editorial team Nov 5, 2003

Cedip Infrared Systems chose the Opto 2003 meeting in Porte de Versailles, Paris (France) to present its latest products for industrial imaging and spectroscopic applications.

Cedip Infrared Systems chose the Opto 2003 meeting in Porte de Versailles, Paris (France) to present its latest products for industrial imaging and spectroscopic applications.

At this important meeting, considerable interest was shown in the low-cost Jade UC camera whose standard USB 2.0 digital output allows users to display digital images at a rate of 60Hz over a 14bit dynamic range.

Operating with Cedip's intuitive Altair software the camera uses the USB 2.0 drivers to control and display high resolution IR imagery as well as to offer radiometrically calibrated data.

Packaged in a sealed unit the robust Jade UC offers IP54 standard protection against the ingress of rain and humidity.

This makes it the perfect IR camera for automation and machine vision applications including paper production, glass inspection, food processing and plastics manufacturing.

Also on display the Jade SWIR camera drew particular interest from the spectroscopy community.

Uniquely able to offer a high quantum efficiency response from 800 to 2500nm make the Jade SWIR camera particularly well suited for applications in time resolved spectroscopy.

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