Noncontact imaging of stress in materials
A
Cedip Infrared Systems product story
Edited by the Engineeringtalk editorial team
Jan 22, 2004
Based on a high-performance focal plane array camera and digital image processing software, the Altair Li system produces high-quality images of stress in materials and structures under dynamic loads.
Based on a high-performance focal plane array camera and digital image processing software, the Altair Li system from Cedip Infrared Systems produces high-quality images of stress in materials and structures under dynamic loading conditions.
When a structure undergoes cyclic loading as during fatigue testing, small temperature changes are produced at the material surface.
Under adiabatic conditions, there is a linear relationship between temperature variation and localised stress.
The Altair Li system employs an advanced Jade infra-red focal plane array camera to provide noncontact thermal images of the area of the sample under stress at fast frame rate.
Using proprietary software these thermal images are converted into full field stress images in real time.
The Altair Li system has the versatility to provide precise stress testing of structural components under random, transient or dynamic loading.
In applications where there is a large displacement a novel software feature is available to provide accurate motion compensation.
When used to measure heat dissipation on a structure under dynamic loading (D-mode) the Altair Li system can also be used to rapidly determine the materials fatigue limit and provide information on the damage mechanism involved.
The systems' advanced operational capabilities are illustrated with a range of applications examples in new technical brochure that also provides full technical specifications and an introduction to the Altair Li system.
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