Top resolution from thermography workstation
A
Cedip Infrared Systems product story
Edited by the Engineeringtalk editorial team
Feb 11, 2004
The Altair advanced thermography workstation is designed to meet the thermal analysis requirements of the most demanding scientific, process control and nondestructive testing applications.
The Altair advanced thermography workstation is designed to meet the thermal analysis requirements of the most demanding scientific, IR signature analysis, process control and nondestructive testing applications.
Based upon Cedip's Jade infra-red technology the multispectral Altair advanced thermography workstation offers market-leading thermal sensitivity, wide dynamic temperature range and high-speed image acquisition capabilities.
With a choice of the highest performance InSb or MCT focal plane array detectors the Altair advanced thermography workstation achieves outstanding sensitivity of less than 20mK even at the highest frame rate (200Hz full image format/15kHz subwindow mode).
High performance detectors with large filling factor ratios and low nonuniformity response accurately matched with proprietary optics provide unmatched high-resolution imagery.
Where applications require a wide single measurement range to avoid loss of data a software option is available providing a single range of measurement from 0 to 900C.
Coupled with Cedip's powerful, yet intuitive Altair software, the system provides users with the capability to store and analyse sequences of radiometrically calibrated 14bit digital images, even when operating at high frame rates.
Complimenting the systems high performance the open architecture design and flexible operator interface provides researchers with instant access to all setup parameters.
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