Infra-red camera spots material stresses

A Cedip Infrared Systems product story
Edited by the Engineeringtalk editorial team Jan 15, 2008

The Altair Li system can be used to rapidly determine the material's fatigue limit and provide information on the damage mechanism involved.

The Altair Li system from Cedip Infrared Systems provides images of stress in materials and structures under dynamic, transient or random loading conditions.

It uses a high-performance focal plane array camera and digital image processing software The Altair Li uses an IR camera which provides thermal images of the area under investigation at a fast frame rate.

These thermal images are converted into full field stress images, without any contact with the material surface.

The full field stress images are produced in real-time by using the thermoelastic effect which states there is a linear relationship between the temperature changes induced by loading and the stress at the material surface.

When used to measure heat the Altair Li system can be used to rapidly determine the material's fatigue limit and provide information on the damage mechanism involved.

When dealing with real structures, the relative motion of different parts can create artefact images.

To eliminate these unwanted ghost images, Altair Li includes a software facility for motion compensation with sub-pixel accuracy.

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