Product category:
Vision and Colour Sensors
News Release from: Cognex UK | Subject: In-Sight 1721
Edited by the Engineeringtalk Editorial
Team on 18 July 2005
Sensor reads wafer IDs faster
Used for tracking semiconductor wafers through the fab process, the In-Sight 1721 offers a slimmer package and twice the speed of its predecessors.
Cognex has expanded its family of wafer ID readers to include the In-Sight 1721 Used for tracking semiconductor wafers through the fab process, the In-Sight 1721 offers a slimmer package and twice the speed of its predecessors, yet maintains mounting and functional compatibility with them
This article was originally published on Engineeringtalk on 12 Mar 2001 at 8.00am (UK)
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"As manufacturers move toward full wafer traceability, they are more dependent than ever on reliable automated wafer identification", said Justin Testa, Senior VP of ID Products for Cognex.
"The In-Sight 1721, the newest member of Cognex's series of industry-leading wafer readers, reads faster with higher yield under difficult real world process conditions".
Advanced image formation technology and industry-leading OCR, 2D matrix, and barcode recognition algorithms enable the In-Sight 1721 to deliver reliable reading performance on SEMI-standard scribes.
The 1721 also provides exceptionally high read rates on wafer marks that have been affected by CMP, edge beads, copper metallisation, blue or green nitride coating, and other process effects.
The In-Sight 1721 offers flexible mounting options for easy installation on wafer sorters, ion implanters, probers and other tools.
A graphical user interface simplifies setup, and automatic tuning minimises operator intervention.
Built-in network and serial communications provide connectivity to other process tools and the fab network.
The In-Sight 1721 will be available in September. Request a free brochure from Cognex UK ...
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