Product category:
Testing, analysing and monitoring equipment
News Release from: Fischer Instrumentation (GB) | Subject: XDL
Edited by the Engineeringtalk Editorial
Team on 23 June 2003
Analyser takes on multilayer coatings
A new standard of excellence has been claimed for Fischer's standard coating thickness X-ray product, the XDL.
A new standard of excellence has been claimed for Fischer's standard coating thickness X-ray product, the XDL Core to the XDL's success is the new FTM software for Windows 9X, XP, NT and 2000, which enables a unique analysis of the fluorescence spectrum
In simple terms, up to 24 elements can now be analysed.
Accuracy down to pixel level is also possible with digital autofocusing and programming functions have been added for array measurements, for example to map surfaces for coating build up.
Measurements can be taken of multiple layers where one coating can be analysed under another and if the coating system is complex, there's a simple setup with auto-calculation of the maximum thickness which can be measured. Request a free brochure from Fischer Instrumentation (GB) ...
• Fischer Instrumentation (GB): contact details and other news
• Email this article to a colleague
• Register for the free Engineeringtalk email newsletter
• Engineeringtalk Home Page
Search the Pro-Talk network of sites
