Product category:
Level Sensors and Leak Detectors
News Release from: Introtek | Subject: Dual redundant circuits
Edited by the Engineeringtalk Editorial
Team on 25 July 2006
Introtek to introduce dual redundant
circuits
A dual redundant approach utilises two separate and complimentary electronics sections to monitor a single air detection sensor
Introtek International has announced plans to make available the option of dual redundant circuits for their line of ultrasonic sensors beginning in June of 2006 "The ultrasonic sensor has gained a reputation as an extremely reliable and long-lasting component with medical device manufacturers as well as many companies with industrial applications"
This article was originally published on Engineeringtalk on 15 Mar 2005 at 8.00am (UK)
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"Currently, the ultrasonic sensors designed and manufactured by Introtek are documented to have a MTBF (Mean Time Between Failure) rate of .707 failures per million hours or one failure every 1.4 million hours," said Joe Mariano, Chief Engineer of Introtek.
"Introtek has decided to offer the option of dual redundant circuitry".
"This will take us to the next level of ultrasonic reliability".
"We believe the option of adding dual redundancy to the circuitry of our sensors to be invaluable for our customers that may require more stringent criteria," said Deb Corwin, General Manager of Introtek.
"There are Introtek sensors operating flawlessly going on nine years or more for our customers".
"But with dual redundancy, there is another layer of 'fail-safe' operation".
A dual redundant approach utilises two separate and complimentary electronics sections to monitor a single air detection sensor.
These two sections have separate and independent output lines.
The wet condition is defined as both outputs being high.
The dry condition is defined as either Output being low.
Should any single component failure occur, the failure will now be isolated to one Output or the other (thus the other Output will remain valid), or force both Outputs to the dry (safe) condition.
As the two electronics section operate independently from each other, a failure in one section would not cause a failure in the other.
This allows time to test for a failure in one section before the remaining working section too could fail.
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