Product category:
Form/co-ordinate, optical and vision instrumentation
News Release from: Horiba Jobin Yvon | Subject: Uvisel ellipsometer
Edited by the Engineeringtalk Editorial
Team on 23 April 2004
Ellipsometer excels at thin-film
measurements
The Uvisel spectroscopic phase modulated ellipsometer allows the accurate characterisation of thickness and refractive index for single- and multiple-layer thin-film structures.
The Uvisel spectroscopic phase modulated ellipsometer from Jobin Yvon Horiba Group allows the accurate characterisation of thickness and refractive index for single- and multiple-layer thin-film structures Thickness determinations from a few angstroms to tens of microns are possible for complex structures found in semiconductor, flat panel display, optical coating, polymer film and biological applications
This article was originally published on Engineeringtalk on 25 Oct 2000 at 8.00am (UK)
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Performance spectroradiometric system is economic
Jobin Yvon is pleased to introduce the SpectRad Gemini - a dedicated, fully integrated, spectroradiometric system offering high performance at an economical price.
The Uvisel ellipsometer is claimed to deliver the highest combination of measurement precision, accuracy and ease-of-use for demanding research and industrial quality control.
The unique features of the instrument include a wide spectral range from 190 to 2100nm, integrated microspot optics and turnkey software package for automatic operation.
A large variety of accessories are available to match the instrument to the needs of the application.
The Uvisel ellipsometer delivers unprecedented versatility and flexibility and functionality and is recognised to be the gold standard for thin-film characterisation.
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