Product category:
Materials testing equipment
News Release from: Horiba Jobin Yvon | Subject: MM-16
Edited by the Engineeringtalk Editorial
Team on 02 April 2007
Ellipsometer loaned free of charge
The MM-16 liquid crystal modulation spectroscopic ellipsometer is so easy to set up and use that Horiba Jobin Yvon is offering to loan it free of charge.
The MM-16 liquid crystal modulation spectroscopic ellipsometer is so easy to set up and use that Horiba Jobin Yvon is offering to loan it free of charge The company is seeking proposals for a suitable experiment that would make use of the MM-16's capabilities and that can be completed in a week
This article was originally published on Engineeringtalk on 6 Nov 2006 at 8.00am (UK)
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Ellipsometer characterises thin films
Pectroscopic ellipsometer is dedicated to the advanced characterisation of film thickness and optical constants for a broad range of materials.
The MM-16 is ideally suited for semiconductor, optical coatings, chemistry, biology, and in-situ real-time control applications.
In less than 2s the MM-16 collects full spectral ellipsometric data and calculates film thickness and refractive index even on multilayer or patterned samples.
The MM-16 can be operated as a turnkey system with automated x-y stage for routine operation as well as for research activity.
The MM-16 is unique in its ability to deliver the complete 16-element Mueller matrix in less than 2s, in one measurement.
As a result the ellipsometric angles and the derived sample characteristics are determined with very high accuracy and precision.
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