Free web seminars on useful instrumentation topics
A
Keithley Instruments product story
Edited by the Engineeringtalk editorial team
Jan 16, 2002
Two free web seminars over the Internet in January 2002 cover How to Get the Most from Your Low Current Measurement Instruments, and How to Optimize Laser Diode Parametric Test Throughput
Keithley Instruments is to broadcast two free web seminars over the Internet in January, 2002.
Each seminar will last approximately one hour.
A team of Keithley experts will be on hand during the broadcast to answer questions live over the Internet.
RealPlayer or Windows Media Player is required to watch this event.
If these tools are not available, they can be downloaded during registration or right now from http://webevents.broadcast.com/keithley/lcm0102/download.asp.
The two free seminars cover the following topics : 1 - How to Get the Most from Your Low Current Measurement Instruments.
This web-based seminar will describe the basics of low current measurement.
This is the second installment of the Low Level Measurements seminar series.
By participating in the seminar, you will learn: - How to use product specifications to pick the right current measurement instrument; - Practical ways to reduce current noise in measurement set-ups; - Most importantly, how to quantify subtle sources of noise.
This 45-minute program is a simple introductory course in the basics of low current measurements.
The seminar will be presented by Adam Daire, a Product Line Manager for Keithley Instruments' Research and Education Group, on January 23, 2002 at 3:00 PM CET (2 PM GMT).To register for this event, and for further information and help on getting setup for this webcast, go to http://webevents.broadcast.com/keithley/lcm0102/register.asp.
2 - How to Optimize Laser Diode Parametric Test Throughput.
This web-based seminar will describe considerations in optimizing accuracy and throughput of DC laser diode parametric test.
By participating in the seminar, you will learn: - Where in the manufacturing process L-I-V testing is typically pereformed; - Drive Current Step Size Considerations; - ADC type considerations; - Optical detector head considerations; - Value of test synchronization and automation hooks; - Possible solutions.
This one-hour program is a simple introductory course in how to optimize laser diode parametric DC test throughput.The seminar will be presented by Paul Meyer, a Product Marketer in the Optoelectronics Component Test Group at Keithley Instruments on January 30, 2002 at 3:00 PM CET (2 PM GMT).
To register for this event, and for further information and help on getting setup for this webcast, go to http://webevents.broadcast.com/keithley/oldp1201/register.asp.
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Contact Keithley Instruments
Tel +49 898 4930740
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