Keithley plans semiconductor C-V webinar
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Keithley Instruments product story
Edited by the Engineeringtalk editorial team
May 28, 2009
Keithley Instruments will broadcast a free one-hour web seminar titled 'Semiconductor Capacitance-Voltage (C-V) Fundamentals', presented by Electronic Design magazine, on 2 June at 14:00.
This webinar will introduce the topic of C-V measurements as they relate to semiconductor device and materials characterisation.
C-V testing is commonly used to determine semiconductor parameters such as doping profiles, density of interface states, threshold voltages, oxide charge and carrier lifetime.
The Keithley webinar is targeted at: engineers that are new to semiconductor materials and device testing; process and device engineers that would like to refresh their knowledge of this testing methodology; and characterisation lab managers.
The webinar will describe what C-V testing is, the types of devices C-V testing can be used to characterise, who can use it and the challenges associated with making C-V measurements.
Lee Stauffer, senior staff technologist for Keithley's Semiconductor Measurements Group, will present the webinar and take questions from the audience.
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