Keithley to present workshop on LTE testing
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Keithley Instruments product story
Edited by the Engineeringtalk editorial team
Jul 27, 2009
Keithley Instruments will be presenting a two-hour workshop entitled 'LTE testing - understanding how your LTE radio is performing' on the first day of European Microwave Week (EuMW).
Attendance at the workshop is free of charge, but registration is required.
Presented by Keithley's RF specialist Mark Elo, the workshop will look at the challenges associated with verifying the performance of the physical layer of an LTE radio, including a review of OFMD/MIMO essentials and how they relate to the LTE PHY layer.
The workshop will conclude with a range of practical examples and experiments, including measurement techniques for gain compression, frequency/time EVM analysis and channel/stream manipulation.
The workshop is designed as a platform to exchange thoughts with the RF community, and attendants are encouraged to ask questions and to discuss their applications and test solutions.
Keithley Instruments addresses the ongoing convergence of wireless telecommunications with wireless data communications through solutions for the testing of multiple radio, multiple standard, and multiple antenna commercial devices and infrastructure.
Keithley will be exhibiting its latest products in RF/wireless test at EuMW 2009 on stand 327C.
EuMW takes place in Rome, Italy, from 29 September to 1 October 2009.
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