Keithley to host C-V testing seminar

Keithley Instruments has announced a free 45-minute online seminar entitled 'Semiconductor Capacitance-Voltage (C-V) Testing Fundamentals'.

The seminar will introduce the topic of C-V measurements in relation to semiconductor device and materials characterisation.

It is recommended for engineers who are new to semiconductor materials and device testing and those that want to refresh their knowledge of the subject.

Participants will gain an insight into what C-V testing is, the types of devices C-V testing can be used to characterise, who can use it and the challenges associated with making C-V measurements.

Lee Stauffer, senior staff technologist for Keithley's Semiconductor Measurements Group, will present the seminar and take questions from the audience at the end.

The seminar will be broadcast on Thursday 29 October at 15:00 CET to enable engineers based in Europe to participate in the live event.

The webcast is free to attend, but registration is required.

For detailed seminar information and to register, visit Keithley's website.

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