Laser probes are integrated into CMMs
Wenzel CMM systems can now be quickly and easily retrofitted with Laser Design laser scanning probes for exponentially increased speed in simple and complex measurement applications
Laser Design's line-laser Surveyor Laser Probes (SLP) are now fully integrated with Wenzel CMMs.
This means that Wenzel CMM systems can be quickly and easily retrofitted with Laser Design laser scanning probes for exponentially increased speed in simple and complex measurement applications.
The Laser Design CMM laser probe package is designed to mount precisely and take full control of the system's motion control electronics with its Surveyor Scan Control (SSC) software.
The SSC software also controls the Renishaw PH10 motorised indexing heads.
Laser Design also offers an optional fourth axis, high-precision rotary stage.
The PH10 and rotary stage options allow automatic unattended scanning with the laser probe.
Once the laser kit is installed, the Wenzel CMM can output high-density scan data to the system's bundled software for both inspection/verification and reverse engineering solutions.
Easy to set up, 3D laser scanning inspections are fully automated and accurate to 12 microns.
Results are shown via colour error maps comparing the scan data to the original CAD model.
Specific feature measurements can also be extracted from the point cloud data and, once set up, reports are generated automatically.
Laser scanning is typically ten times faster than the most advanced touch probes' speed; Laser Design's SLP lasers are able to collect over 75,000 3D co-ordinates per second.
CAD surface models are output in the IGES or STEP formats, or as parametric solids models.
"This is a great option for Wenzel CMM owners who have been asking for laser scanning capabilities", commented C Martin Schuster, President of Laser Design.
"The retrofit laser scanning probe is basically plug-and-play, so the incredible speed and accuracy of noncontact laser measurement can be added to Wenzel systems quickly and easily".
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