Product category:
Electric Linear Actuators
News Release from: Lambda Photometrics | Subject: P-733.DD piezo stages
Edited by the Engineeringtalk Editorial
Team on 05 November 2003
Top speed stage for scanning microscopy
Physik Instrumente has developed what it claims to be the world's fastest multi-axis, scanning stage for scanning microscopy.
Physik Instrumente has developed what it claims to be the world's fastest multi-axis, scanning stage for scanning microscopy PI works closely with leading Scanning Nearfield Optical Microscope researchers and has incorporated their feedback into the design of the P-733.DD piezo stages
This article was originally published on Engineeringtalk on 25 Feb 2000 at 8.00am (UK)
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Viewing infrared wavelengths between 0.4-1.5microns, the converted image produced by the new 7215 is now brighter and offers edge to edge sharpness.
The high resonant frequency of 2.3kHz (400% higher than conventional stages) allows scanning rates of hundreds of hertz - important for capturing transient data.
Due to the novel parallel-kinematics layout, both the x and y axis achieve identical dynamic performance - a prerequisite for improved imaging speed and linearity.
The new design is also 20% thinner for easy integration into microscopes.
Equipped with ultra-high-resolution capacitive position feedback in a parallel-metrology configuration the new stages also achieve better straightness of travel.
Parallel metrology can "see" all controlled degrees of freedom simultaneously and compensate for the slightest off-axis motion in real time.
The benefits are reduction of runout and off-axis errors, straighter motion and improved repeatability.
A variety of high-speed analogue and digital controllers with Windows software are available to drive the stages. Request a free brochure from Lambda Photometrics ...
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