Top speed stage for scanning microscopy
A
Lambda Photometrics product story
Edited by the Engineeringtalk editorial team
Nov 5, 2003
Physik Instrumente has developed what it claims to be the world's fastest multi-axis, scanning stage for scanning microscopy.
Physik Instrumente has developed what it claims to be the world's fastest multi-axis, scanning stage for scanning microscopy.
PI works closely with leading Scanning Nearfield Optical Microscope researchers and has incorporated their feedback into the design of the P-733.DD piezo stages.
The high resonant frequency of 2.3kHz (400% higher than conventional stages) allows scanning rates of hundreds of hertz - important for capturing transient data.
Due to the novel parallel-kinematics layout, both the x and y axis achieve identical dynamic performance - a prerequisite for improved imaging speed and linearity.
The new design is also 20% thinner for easy integration into microscopes.
Equipped with ultra-high-resolution capacitive position feedback in a parallel-metrology configuration the new stages also achieve better straightness of travel.
Parallel metrology can "see" all controlled degrees of freedom simultaneously and compensate for the slightest off-axis motion in real time.
The benefits are reduction of runout and off-axis errors, straighter motion and improved repeatability.
A variety of high-speed analogue and digital controllers with Windows software are available to drive the stages.
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