Product category:
Electrical and Electronic Testing and PAT Equipment
News Release from: LEM Instruments | Subject: Micro Clamp current probes
Edited by the Engineeringtalk Editorial
Team on 15 April 2003
Current probes pack in the features
The new Micro Clamp series of AC current probes from LEM for current measurements up to 300A RMS combine a lot of features in a compact design.
The new Micro Clamp series of AC current probes from LEM for current measurements up to 300A RMS combine a lot of features with the smallest design (116 x 43 x 23mm) with a capacity jaw for cables with 15mm maximum conductor size The measured values are available at the output as current or voltage (AC or DC) signal on sockets or cable connection with an accuracy of +/-1% of the reading
This article was originally published on Engineeringtalk on 19 Jul 2005 at 8.00am (UK)
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Machine tester extends to switch and control gear
LEM has introduced an adapter that allows its MT204 machine tester to carry out tests on machine switch and control gear in accordance with IEC/EN60439.
The state-of-the-art design with the latest transformer technology offers a wide dynamic range and a large bandwidth from 30Hz to 40kHz.
The new probes' design incorporates a unique safety feature for short-circuit protection called SIAC.
Due to the absence of the jaw tip protection (which is necessary in other designs), these probes have several distinct advantages.
These include easy access in space-restricted areas, no friction when closing the jaws, easy cleaning, and unlike classic protection, the SIAC mechanism ensures no probe wear, due to abrasion or shocks from conductors.
The new Micro Clamp probes comply with relevant safety standards and satisfy the needs of professional electricians in the field of service and maintenance and are an essential tool for power quality tasks.
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