Product category:
Form/co-ordinate, optical and vision instrumentation
News Release from: Lot-Oriel
Edited by the Engineeringtalk Editorial
Team on 09 March 2005
Workshop to explain surface profiling
The next KLA-Tencor surface profiler workshop will take place on Wednesday 27th April 2005, where both the Alpha-Step IQ 2D profiler, and the all new P-15 3D profiler will be on show.
The next KLA-Tencor surface profiler workshop will take place on Wednesday 27th April 2005, where both the Alpha-Step IQ 2D profiler, and the all new P-15 3D profiler will be on show The workshop will feature a specialist from KLA-Tencor USA presenting the release of the newest generation of the market leading P-15 surface profiler
This article was originally published on Engineeringtalk on 16 Dec 2003 at 8.00am (UK)
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Delegates are invited to bring samples a along to the workshop to run in the afternoon session.
Full analysis reports will be generated for every sample.
The market leading P-15 stylus surface profiler from KLA-Tencor is capable of providing 2D and 3D topographic measurements with guaranteed 0.75nm repeatability of a wide range of surfaces.
It is ideal for step height, CMP, MEMS, LCD, flat panel and many other applications.
The system now has a Windows XP operating system along with the new powerful "Mountains" analysis software.
The budget Alpha-Step IQ stylus surface profiler from KLA-Tencor has guaranteed 0.8nm step height repeatability.
The software encompasses the most complete suite of two-dimensional analysis features on the market today and is perfect for a variety of surfaces including wafers, MEMs, ceramics, SIMs craters, microlenses and displays.
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