Workshop to explain surface profiling

A Lot-Oriel product story
Edited by the Engineeringtalk editorial team Mar 9, 2005

The next KLA-Tencor surface profiler workshop will take place on Wednesday 27th April 2005, where both the Alpha-Step IQ 2D profiler, and the all new P-15 3D profiler will be on show.

The next KLA-Tencor surface profiler workshop will take place on Wednesday 27th April 2005, where both the Alpha-Step IQ 2D profiler, and the all new P-15 3D profiler will be on show.

The workshop will feature a specialist from KLA-Tencor USA presenting the release of the newest generation of the market leading P-15 surface profiler.

Delegates are invited to bring samples a along to the workshop to run in the afternoon session.

Full analysis reports will be generated for every sample.

The market leading P-15 stylus surface profiler from KLA-Tencor is capable of providing 2D and 3D topographic measurements with guaranteed 0.75nm repeatability of a wide range of surfaces.

It is ideal for step height, CMP, MEMS, LCD, flat panel and many other applications.

The system now has a Windows XP operating system along with the new powerful "Mountains" analysis software.

The budget Alpha-Step IQ stylus surface profiler from KLA-Tencor has guaranteed 0.8nm step height repeatability.

The software encompasses the most complete suite of two-dimensional analysis features on the market today and is perfect for a variety of surfaces including wafers, MEMs, ceramics, SIMs craters, microlenses and displays.

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