Atomic force microscopy enters new generation
A
Lot-Oriel product story
Edited by the Engineeringtalk editorial team
Jun 12, 2006
Pacific Nanotechnology has developed a new generation of atomic force microscopy (AFM) systems.
Pacific Nanotechnology has developed a new generation of atomic force microscopy (AFM) systems.
It uses enhanced hardware and software to deliver a productive, easy-to-use system.
The Nano-R2 has many advanced features including dual LCD monitors, advanced image acquisition software and a new 16/32 bit controller architecture.
The Nano-R2 is compatible with all the optional features available for the popular and well-established Nano-R which offered a stage heater, environmental cell, and NanoRule+ software.
The Nano-R2 is a multipurpose scanning probe microscope for capturing images and making measurements of structures on the nanometre scale.
It has been optimised for both novice and expert users through having two versions of image acquisition software, X'pert and EZMode.
Purchase of the Nano-R2 provides the user with a complete package for AFM imaging.
The master computer is backed with dual LCD monitors to visualise both the sample surface and probe while being able to interact with the control and analysis software.
The system is completed with a control unit and theNano-R2 stage unit.
Users may choose between the conventional Light Lever AFM-scanner and the advanced Crystal Force Microscope scanner.
The LL-AFM is best suited to the visualisation of nanostructures and making mode measurements while the CFM is ideal for routine topographic and metrology measurements.
Ease of probe replacement, alignment of probe and sample positioning with a high resolution colour video optical microscope all go to make the system easy to learn to use, vital in the laboratory environment where being able to use many techniques as possible is the requirement for today's materials characterisation scientist.
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