Nuclear event detectors set to minimise damage

Micro Circuit Engineering and Matra BAe Dynamics are collaborating in the promotion of a family of nuclear event detectors which will protect electronic systems after a nuclear incident

Micro Circuit Engineering (MCE) and Matra BAe Dynamics are collaborating in the promotion of a family of nuclear event detectors which will protect electronic systems from one of the effects of a nuclear incident.

A pulse of electro-magnetic radiation is just one of the devastating consequences of exploding nuclear weapons.

It produces electrical surges in electronic components which can damage or destroy them.

The nuclear event detectors from MCE will respond to even 'low level nuclear events' and switch off power to electronic circuits in time to prevent damage from the electro-magnetic pulse.

The detectors have a robust 'fail safe' mechanism to avoid the protection being accidentally triggered during normal operation.

They operate over the entire military temperature range and can be easily integrated into systems for support of nuclear hardened designs - for use in tactical nuclear environments, for example.

MCE is now producing the detectors under licence from Matra BAe Dynamics.

It can supply the devices either as discrete components or integrated into customised electronic modules for specific applications.

The company - part of the Aerospace Division of Smiths Group - is a leading supplier of high reliability electronics for aerospace, defence, industrial, telecommunications, computer and medical applications.

MCE Newmarket specialises in the design and manufacture of customised electronic modules.

Back to top