Product category:
Form/co-ordinate, optical and vision instrumentation
News Release from: Metris
Edited by the Engineeringtalk Editorial
Team on 20 April 2004
Pair to promote noncontact scanning
LK has selected Metris as a strategic partner for noncontact scanning solutions.
LK has selected Metris as a strategic partner for noncontact scanning solutions The decision to partner with Metris was endorsed by the technical potential of the new Metris XC50 cross scanner
LK will actively promote Metris' range of laser scanners and reverse engineering software.
This strategic alliance further strengthens the existing relationship between the two companies.
LK and Metris have both decided to invest in each other's technology to allow their respective sales staff to fully demonstrate the capabilities of the new scanning solutions.
As a result Metris headquarters recently completed the installation of a LK CMM in its metrology room.
The availability of the LK CMM will significantly facilitate the further integration of the Metris technology in LK inspection solutions.
Laser scanning is a well-established technology that is now available on LK CMMs due to advances in design, miniaturisation and the use of lightweight materials.
It removes many restrictions of traditional contact measurement probes.
Today, laser scanning enables complete modelling and inspection of complex freeform, multi-filleted or featured parts.
Due to its noncontact nature, laser scanning is also perfectly suited for measuring flexible or fragile materials, which often present severe challenges for touch probes due to the risk of indentations or surface scratches.
Metris laser scanners are designed to operate on the LK CMM using CAMIO Studio and through the Renishaw PH10M and multiwire, which results in plug and play integration without additional wiring.
LK CMMs are particularly suitable for laser scanning due to their advanced controller technology.
The Metris probes acquire data at the rate of 19,200 points per second, producing a dense, highly accurate point cloud of the part.
As such, the time needed to measure complex parts reduces from hours or days to minutes.
In addition to full part digitisation solutions, LK and Metris offer software modules for computer aided inspection (CAI) and reverse engineering.
LK's Camio software provides powerful, DMIS compatible, tools for the complete inspection of features and collection of point cloud data.
Scanned point clouds are compared with the original CAD model, providing both traditional inspection reports and powerful 3D graphical colour maps showing deviations and trends across the complete part.
This technique can be applied across a variety of quality control processes such as first article inspection, in line inspection, feature inspection, trouble shooting for pre-production approval (PPAP) and supplier quality issues.
The point cloud can also be used for a variety of reverse engineering applications in the digital development cycle such as conceptual design and visualisation, surfacing and modelling, legacy data processing, tooling modification and repair, and manufacturability analysis.
This integrated hardware and software combination allows measurement and inspection cycle times to be drastically shortened, thereby increasing measurement efficiency and reducing costs.
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