Product category:
Form/co-ordinate, optical and vision instrumentation
News Release from: Metris | Subject: K-Scan
Edited by the Engineeringtalk Editorial
Team on 19 May 2005
Fast setup for walk-around scanning
solution
The K-Scan is a powerful, walk-around scanning solution combining the Metris LC50 laser scanner and the Krypton K600 optical portable CMM.
New from Metris, the K-Scan is a powerful, walk-around scanning solution combining the Metris LC50 laser scanner and the Krypton K600 optical portable CMM The K-Scan is ideally suited for on-site 3D digitising tasks where minimal setup times and fast results are key requirements
This article was originally published on Engineeringtalk on 6 Jun 2003 at 8.00am (UK)
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Integrated solution for CMM based laser scanning
Scan 3.0 software is the driving force behind Metris' range of scanning solutions integrated on co-ordinate measurement machines.
The K-Scan houses the Metris LC50 line scanner in a robust and lightweight housing, equipped with LEDs.
These LEDs are constantly tracked by the Krypton K-series optical portable CMM.
The resulting pointclouds, acquired at a rate of 20000 points per second, are further analysed in the Metris Focus software.
The K-Scan is equipped with 20 LEDs for optimal tracking by the Krypton K-series camera.
Dependant on the camera type, the user can select a measurement volume from 1 up to 6m.
The measured component can also be equipped with LEDs enabling the user to dynamically reference the measured parts.
It is therefore possible to reposition the part without the need for re-alignment.
The K-Scan is designed to work with the standard LC50 scanner.
This multifunctional concept allows customers to standardise on the Metris scanner for fixed CMMs and also for portable optical systems.
With this new capability the K-Scan expands the usability of Metris laser scanners from repetitive inspection on an automated CMM to a fast, portable measurement solution for troubleshooting and on-site measurements.
The surface scan results in a 3D pointcloud that can be further analysed in Metris Focus software applications such as full part to CAD inspection or reverse engineering.
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