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Optical pens show their versatility

A Micro Photonics product story
Edited by the Engineeringtalk editorial team Mar 30, 2006

Modular design of confocal chromatic optical pens allows up to 30 configurations for specific depth of field, spot size, working distance, object slope and photometric efficiency.

Micro Photonics has introduced confocal chromatic optical pens for profilometry, microtopography, roughness, auto-focus vibrometery, in-line inspection quality control and thickness measurements.

The modular design allows up to 30 optical pen configurations for specific depth of field, spot size, working distance, object slope and photometric efficiency.

Users can choose from a selection of five magnifiers, ranging from 3.3 to 29mm focal lengths, and six chromatic lenses, 130um to 27mm depth of fields.

Pens can achieve maximum axial resolution of 5nm, accuracy to 20nm and maximum slope to 87 degrees for diffusive objects.

Based on white light chromatic aberration, the pens have lateral resolution of 1.1um and vertical resolution of 5nm, which make them a better choice than laser triangulation sensors for applications where high resolution measurements are critical, as sometimes found in vibrometry, in-line inspection and quality control.

For difficult materials such as textiles, polymers, black or dark blue materials, high aspect ratio surfaces, and materials of low reflectivity, white light chromatic aberration is often the only appropriate technique.

"Clients have known of this technique, and its benefits for OEM applications, but because of the price it was passed on in favour of cheaper laser sensors", said Pierre Leroux, General Manager of the surface test division.

"The new prices are 40% lower on average, which will make a difference".

Acquisition speed to 30kHz meets specific vibrometry, in-line and off-line quality control requirements.

The system can be used as a stand-alone unit or connected to a computer using various software packages.

Integrated products such as the micromeasure profiler and micromeasure dual scanner are also available for 3D surface imaging.

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