NI partners Test System Strategies
A
National Instruments product story
Edited by the Engineeringtalk editorial team
Jul 17, 2009
National Instruments (NI) has announced a collaboration with Test System Strategies (TSSI) on a software tool that is compatible with NI Labview graphical system design software.
TSSI is the inventor of the Waveform Generation Language (WGL).
The new software tool makes it possible for semiconductor test engineers to import WGL and IEEE 1450 Standard Test Interface Language (STIL) simulation vectors into NI PXI digital test systems, a task that previously required custom software development.
Evaluation versions of the TSSI TD-Scan for National Instruments software will be available by request from National Instruments, while the full version can be purchased from TSSI.
'Our collaboration with National Instruments unites our semiconductor design-to-test solutions with NI automated test controller technology and helps us both meet the needs of semiconductor test engineers,' said Dave Karpenske, senior vice-president for sales and marketing at TSSI.
The WGL and STIL vector formats are commonly used by engineers to run tests on semiconductor devices during the characterisation, design validation and production test phases of product development.
These vectors are generated by electronic design automation (EDA) tools and used to stimulate a fabricated device to verify that its physical implementation matches the results achieved in simulation.
The vectors are applied using digital test equipment with capabilities similar to the NI PXI-6552 100MHz digital waveform generator/analyser with features such as per-cycle tri-stating, onboard vector comparison and clock data delay.
The TSSI TD-Scan for National Instruments software eliminates the custom programming previously required to make these vectors work on NI instrumentation by automatically converting the WGL and STIL vectors to native file formats for NI digital test equipment.
By making it possible for engineers to use the vector outputs from EDA software in validation and production tests on NI digital test equipment, the TSSI TD-Scan for National Instruments software increases the efficiency and flexibility of this test process.
Engineers can now read and manipulate WGL and STIL vectors in Labview and the NI Digital Waveform Editor, both of which provide control for all NI digital test hardware.
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