Metrology microscopes automatically correct errors
The MM400/800 series of manual metrology microscopes offers through-the-lens laser autofocus (TTL Laser AF), automatic edge detection and white LED illumination.
A new series of manual metrology microscopes offering greater accuracy, streamlined digital imaging and improved noncontact Z-height measurement has been launched by Nikon Instruments.
The MM400/800 series offers through-the-lens laser autofocus (TTL Laser AF), automatic edge detection and white LED illumination to create the performance needed to meet the demands of modern digital metrology and imaging.
The new microscopes also benefit from new Emax measuring support software, that takes digital metrology and imaging to a new level of precision.
Models within the MM400/800 series are the first Nikon measuring microscopes to be equipped with TTL Laser AF with a 0.5s focusing speed.
The instruments also feature noncontact, z-axis movement and a newly developed split-prism focussing aid (FA) which automatically corrects measurement errors caused by differences in the depth of focus between different objectives.
On the image processing side, Nikon digital cameras and E-max support software simplify microscopic tasks ranging from observation and capture to the storage and management of digital images.
Data processing is handled by the DP-E1 console, which interfaces seamlessly with users' existing PCs for simplified measurements and computation of results.
From an operational standpoint, control of illumination, communication and data processing have all been integrated into a rear-side controller that has been left open-ended for future firmware and application upgrades.
With the MM800 model in particular, it is possible to mount a 300 x 200mm stroke stage.
Improved overall solidity also means each model exhibits excellent reliability during measurements using digital cameras and other accessories.
Commenting on the launch of the new microscope series Chay Keogh, Marketing Manager Nikon UK Instruments, explained, "The MM400/800 series represents a major step forward in measuring microscope technology".
"These systems have been designed with specific needs of metrologists in mind and include new functionalities that will enable them to perform both standard and challenging tasks far more simply".
Data analysis and management have been streamlined and made more userfriendly, illumination capability has been significantly improved and z-axis focusing enhancements provide rapid and clear delineation of patterns.
Recognising that every metrologist has specific operational requirements, each model in the series is also completely modular, allowing users to configure the optimum system for their own individual needs and budgets.
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