Scope for efficiency, reliability and speed
An
Olympus Industrial product story
Edited by the Engineeringtalk editorial team
Jun 28, 2005
LEXT is a new confocal laser scanning microscope for ultraprecise surface analysis.
Olympus has launched LEXT - a new confocal laser scanning microscope for ultraprecise surface analysis.
No preparation is required, samples are placed directly on the microscope stage and both observation and high-precision measurements are possible in real-time 3D.
The superior resolution - 0.12um (x-y) and 0.01um (z) - is coupled to a comprehensive set of observation methods, meaning that every user can make quicker and more accurate specimen analysis with full traceability to International standards.
The LEXT system is capable of exceeding known optical resolution limits, by combining proprietary real-time algorithms with advanced colour and laser scanning confocal microscopy techniques.
This enables unparalleled image quality and signal response.
With its two-channel live image, the LEXT can display both conventional and confocal microscope views in parallel, allowing very rapid focusing and alignment.
Three-dimensional information of the surface is gathered and displayed in real-time with little need for user intervention.
Measurements of heights, lengths, surface angles, and volumes are all easily completed.
More importantly, the LEXT is able to profile objects that are normally difficult to scan using conventional methods, such as those with differing surface properties or slanted regions.
As well as 3D surface measurement, the LEXT system can produce more comprehensive roughness analysis than conventional contact-type gauges.
Measurements are not confined to a straight line, since the user can select the precise area based on the 3D image.
Moreover the contour of the surface can be displayed in various formats and therefore interpretation is much faster and simpler.
The optional motorised scanning stage enables automated image acquisition and simultaneous measurement of several points of the specimen.
The stage navigator allows the programming of predefined grids or individual point settings so that the LEXT can be efficiently used for statistic process control.
By using differential interference contrast (DIC) in combination with the 408nm laser and precise z-scan, brilliant 3D images can be acquired which are beyond the capabilities of conventional laser microscopes.
The LEXT is also excellent for analysing objects where monochrome observation (such as SEM) is restrictive: such as defects in colour filters or metal corrosion.
With these outstanding properties, Olympus reckons LEXT is giving metrology a new dimension - increased efficiency, reliability and speed.
This generates a more comprehensive understanding of surfaces and will help engineers to develop new materials with improved properties.
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