Product category:
FEA and structural analysis software
News Release from: Precision-Optical Engineering | Subject: µShape
Edited by the Engineeringtalk Editorial
Team on 25 September 2001
New phase shift software
Precision-Optical Engineering (P-OE) has extended its range of digital phase shift interferometry analysis software for use with its Interfire 3-5 and Interfire 10.6 infra-red interferometers
As an alternative to the existing OFA phase shift package, P-OE is now also able to offer 'µShape' analysis software, developed by Fisba Optik Phase shift measurements offer increased accuracy for the evaluation of flatness/curvature of optical surfaces in both components and complex optical systems
This article was originally published on Engineeringtalk on 12 Jul 2001 at 8.00am (UK)
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Distributed in the UK by Armstrong Optical, µShape software is available in modular form and will run under Windows 95, 98 and NT operating systems.
The software is supplied complete with a PC-compatible frame grabber and serial interface, allowing direct connection to P-OE's piezo-driven phase shift hardware for movement of the reference optic by around l/2.
The µShape software features a versatile masking facility which enables data to be acquired using a variety of transparent or opaque masks as user-adjustable circles, ellipses, rectangles and polygons.
This allows information to be obtained from different parts of the optical surface under test.
The camera image may be displayed live to help with system set up and the static image can be displayed as a section or 2-D or 3-D image.
The user can choose the particular section of the surface to view and can examine the 3-D visualisations from any angle.
These versatile display formats can be extended to all measured data, such as aberration fields, Modulation Transfer Function (MTF) and slope field.
Another key benefit is that results can be displayed directly in terms of ISO and DIN standards.
An extensive range of fringe analysis functions are provided in modular form to allow the package to be tailored to the particular application.
Measurements include analysis of multiple fringes and full quantitative wavefront analysis including MTF, Point Spread Function (PSF), encircled energy and slope error.
Wavefront shape can be fitted to a Zernike polynomial.
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