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News Release from: PI (Physik Instrumente) | Subject: P-721.CLQ Pifoc
Edited by the Engineeringtalk Editorial
Team on 11 February 2003
Nano-focus device aids imaging
The P-721.CLQ Pifoc is a nano-focus device for applications such as scanning microscopy, cell tracking and surface profiling.
The P-721.CLQ Pifoc is a nano-focus device for applications such as scanning microscopy, cell tracking and surface profiling The new P-721.CLQ is based on the successful Pifoc series of high-speed, piezo-driven, objective nanopositioners
This article was originally published on Engineeringtalk on 26 Nov 2002 at 8.00am (UK)
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The units can be mounted between the turret and objective of any microscope for fast and accurate focus control.
A number of improvements facilitate integration and increase performance.
P-721.CLQs are equipped with direct-measuring, two-plate capacitve position sensors.
Unlike conventional systems, they measure the position of the moving part, rather than the strain of the flexures or actuator.
This technique, combined with the inherent precision of the noncontact capacitive sensor and the temperature compensated design, results in higher linearity scans, superior responsiveness, resolution, repeatability and stability at the nanometer scale.
The result is better image fidelity.
Pifocs feature long-base, frictionless, FEA-modelled flexures for exceptional guiding precision.
The benefit is that lateral motion of the focal point is eliminated when the objective is scanned.
Unwanted lateral motion found in conventional focusing systems causes the acquired images to blur.
The new QuickLock system allows mounting the unit to the turret in a matter of seconds.
A variety of thread inserts are available to adapt the units to any microscope or objective.
Features include: subnanometer resolution and stability, important for detecting smaller feature sizes; an integrated direct-measuring two-electrode capacitive displacement sensor that provides higher performance than any other position sensor; an optional vibration-suppressing signal processor that achieves faster settling and higher throughput; high-speed digital controllers with advanced features such as auto-linearisation improve linearity in high-speed scanning applications; and compatibility with Universal Imaging Corporation software.
A large variety of high-speed, digital and analogue, low-noise, closed-loop controllers (bench-top, rack-mount and OEM modules) is available to suit any need or budget.
A new digital controller provides automatic tracking-error suppression for even higher scanning linearity. Request a free brochure from PI (Physik Instrumente) ...
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