Dithering stages aid resolution enhancement
A
PI (Physik Instrumente) product story
Edited by the Engineeringtalk editorial team
Jul 14, 2005
Two new high-speed x-y dithering stages are designed for use in resolution enhancement and scanning applications.
Nanopositioning specialist PI (Physik Instrumente) introduces the new P-713 and P-714 high-speed x-y dithering stages for resolution enhancement and scanning applications.
These low-cost, piezo-driven stages feature a very high resonant frequency of 2.2kHz for millisecond response.
The parallel kinematic design ensures that the resonant frequency is the same in both axes.
Ideal applications for the P-713 and P-714 are high-dynamics scanning and tracking tasks.
Integrated piezoelectric drives provide subnanometre resolution, important for high-resolution interlacing applications where the optical resolution of a CCD or CMOS sensor is increased by shifting it at high frequency between pixel positions.
The stages feature a very low profile of only 6mm and can also be used in scanning microscopy applications or in static nanopositioning.
The P-713 and P-714 are driven by PI's award wining PICMA ceramic coated piezo actuators.
A range of standard and low cost OEM electronics is available to control these stages.
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Contact PI (Physik Instrumente)
Tel +44 1234 756360
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