Probe takes position in hard-to-reach areas
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Solartron Metrology product story
Edited by the Engineeringtalk editorial team
Sep 7, 2004
It was close consultation with partners in the OEM gauging industry, which lead to the development of Solartron's new Digital Mini Probe.
It was close consultation with partners in the OEM gauging industry, which lead to the development of Solartron's new Digital Mini Probe.
The demand was for a compact, rugged and high accuracy probe for gauging in confined spaces such as bores, cylinders, cones and other hard-to-access areas.
The mini probe is based on a unique, parallel spring structure that is much more robust when compared to the single leaf style, which fails frequently during profiling where key slots or ridges are present.
The parallel spring also ensures a very high level of repeatability both on and across the axis and can be used in dynamic applications where 3906 readings per second are achievable.
The probe offers a 0.5mm measurement range and programmable resolution to below 0.01um.
The mechanical construction of the probe greatly enhances its reliability, extending its working life and allowing it to be used in more demanding applications such as in automatic gauges.
Easy installation into a fixture and rapid on site tip replacement are important benefits that further set the mini probe above the competition.
The probe forms part of the range of digital products sharing Solartron's Orbit Network Interface.
This offers the user a simple plug-and-go measurement and data acquisition system, doing away with the traditional cumbersome analogue conditioning amplifiers and their requirement for additional noise filters.
All digital products are supplied connected to their module allowing for rapid set up.
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