Software controls measurement information

Symbion-RX, Version 1.2 preserves all of the advanced features of Version 1.1 while adding several new capabilities, including a significantly expanded library of mathematical functions.

Symbion Systems, a leader in providing analytical instrument control, analysis, and connectivity software, has released Symbion-DX and Symbion-RX, Version 1.2.

The new version preserves all of the advanced features of Version 1.1 while adding several new capabilities, including a significantly expanded library of mathematical functions.

In common with the earlier versions of Symbion-DX and RX, Version 1.2 provides a standardised application development, networking, and on-line monitoring environment for all process analytical technology requirements.

Both Symbion-DX and RX can be interfaced with a wide range of spectrometers, other analytical instruments, I/O devices, chemometric routines, and enterprise-level software packages.

By providing control, sequencing, and networking, they serve to manage the measurement process, from application development to routine on-line operation.

During development they provide all of the tools needed to design virtually any analytical method.

Once a method has been developed, it can be locked down, provided with a custom operator screens, and deployed for routine online analysis.

In the traditional world of distributed control systems (DCS), relatively simple sensors such as RTDs, flow meters, and pressure gauges yield one dimension (scalar) information which can be processed directly by the dcS.

With advent of process analytical technology, the situation has changed drastically.

An analytical instrument such as a near-infra-red spectrometer may provide as many as 2000 independent spectral data points every few seconds.

This large amount of data must be collected, stored, displayed, transmitted, and processed in such a way as to provide timely and manageable information about the process variables of interest.

Symbion fills this role, bridging the gap between the manufacturing process and the dcS, data historian, or other enterprise-wide data system.

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