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News Release from: Tektronix | Subject: OTS9000 optical test systems
Edited by the Engineeringtalk Editorial Team on 06 October 2000

Innovative technology for optical comms
test

Tektronix has introduced Digital Phase Analysis (DPA), an innovative, best-in-market jitter and synchronisation testing technology for telecommunications networks.

Tektronix has introduced Digital Phase Analysis (DPA), an innovative, best-in-market jitter and synchronisation testing technology for telecommunications networks By introducing DPA technology into its easy-to-use, cost-effective OTS9000 family of optical test systems, Tektronix enables manufacturers and network operators to meet and perform the 10 gigabit per second (Gb/s) test requirements needed to address the ever expanding global communications infrastructure

Jitter is the rapid phase shift of digital pulses over the transmission medium (in this case fibre optic cable).

Excessive jitter causes errors when the data is recovered.

Synchronisation is the co-ordination of communication equipment by clock signals.

When the phase shift between clock signals is excessive, service quality degrades and data is lost.

For consumers, this means a dropped call or poor quality of service.

With the development of today's faster and more complex telecommunications networks, management of jitter and synchronisation is increasingly critical.

'Our customers in the zone - specifically the telecommunications industries - have reached a point in the evolution of their networks where they must be able to perform jitter testing on 10 Gb/s SONET/SDH systems, which are among the fastest, most complex network architectures being deployed globally today', said Scott Bausback, vice president, Communications Business Unit, Tektronix, Inc.: 'We continue to enable the success of our customers by introducing products and technology such as DPA - the only 10 Gb/s all-digital jitter testing solution on the market at the forefront of innovation.' The DPA technology enables jitter and synchronisation analysis critical to equipment manufacturers and network operators because it allows them to perform 10 Gb/s jitter testing on data - not just on clocks - with low intrinsic noise, high jitter accuracy, wide dynamic range, flexible jitter bandwidths and fast settling.

Today, jitter testing has become a crucial part of 10 Gb/s testing because at this high data rate bits are spaced more closely together, so conforming to international jitter standards becomes critical to ensuring error-free data transmission and reception over global communications networks.

The new DPA technology also capitalises on the silicon germanium (SiGe) technology developed by IBM.

SiGe semiconductors provide high performance and lower power consumption at a lower cost than standard silicon, helping to usher in new breeds of applications and communications devices.

In June 2000, Tektronix announced it was the first test and measurement company to employ SiGe technology with the introduction of the TDS7000 series Digital Phosphor Oscilloscope.

The OTS9000 series of products, announced earlier this year, is the first optical test system designed to test dense wavelength-division multiplexing (DWDM) systems at 10 Gb/s.

Based on a modular, common-platform concept, the OTS9000 platform and the field-transportable OTS9010 platform share the same modules and the same Windows-based, easy-to-use graphical user interface (GUI).

These platforms, along with the 10 Gb/s transmission test module, decrease test time, manufacturing and deployment costs and time-to-market by providing user-configurable multi-channel and accelerated bit error rate testing capabilities for DWDM applications.

The 10 Gb/s module allows selection of SONET and SDH through the GUI, provides OC192c/STM64c payloads and a variety of other payload structures, performs section, line and path overhead analysis, and offers overhead editing, error injection and intrusive or non-intrusive through modes.

The platforms are cost effective, in that they accept new modules, such as the 10 Gb/s jitter and synchronisation module, as test requirements grow and change.

In addition to providing test support for equipment manufacturers and network operators, the OTS9000 series is a solution for customers' research, design, and product development labs.

The 10 Gb/s jitter and synchronisation module for SONET/SDH testing for the OTS9000 and OTS9010 platforms from Tektronix will be available in early 2001.

The same module will be able to analyse wander at 10 Gb/s as well as jitter and wander at 2.5 Gb/s, 622 Mb/s and 155 Mb/s, through a software upgrade, which will be available for purchase at a later date.

Prices depend on configurations. Request a free brochure from Tektronix ...

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