Product category:
Electrical and Electronic Testing and PAT Equipment
News Release from: Tektronix | Subject: TDS7254 DPO
Edited by the Engineeringtalk Editorial
Team on 04 June 2001
More bandwidth from Digital Phosphor
Oscilloscope
Using the same SiGe technology found in the TDS7404, the TDS7254 DPO is suitable for a variety of advanced test applications including signal integrity measurements and jitter and timing analysis
Tektronix has announced a new addition to its award-winning TDS7000 Series DPO family The 2.5 GHz Tektronix TDS7254 is based on the same high-performance characteristics, graphical user interface and Open Windows platform as the 4 GHz TDS7404 DPO introduced last year and the world's fastest real time oscilloscope
Using the same Silicon Germanium (SiGe) technology found in the TDS7404, the TDS7254 DPO is suitable for a variety of advanced test applications including signal integrity measurements and jitter and timing analysis.
'Semiconductor speeds in the newest electronics designs are driving the need for high-performance test equipment.
Our customers in the communications and computer industries are finding that the current 2 GHz instruments on the market are simply not providing enough headroom to accurately measure signal integrity', said David Churchill, vice president, Instrumentation Business Unit, Tektronix: 'The TDS7254 fills that performance gap, and provides what is believed to be the most accurate representation of circuit behaviour available at an excellent value for customers who don't need the premium performance of the TDS7404 DPO.' As clock frequencies in the computer and communications industries continue to climb, signal integrity and timing margin issues have become crucial.
The TDS7254 leverages the TekConnectTM signal interconnect system to fully address signal integrity analysis, even when dealing with the 200 ps edges typical of today's high speed components.
An option available with this system includes the 4 GHz (120 ps risetime) P7240 active probe and the 3 GHz (130 ps risetime) P7330 differential probe.
The P7330 provides direct access to differential signals such as LVDS and similar technologies without requiring the user to dedicate two scope channels.
The 20 GS/s real time sample rate and delta-time measurement precision deliver superb jitter analysis results.
Measurements can be made on differential signals and between two separate input channels.
Comprehensive statistics and histograms of the timing parameters, and also trend plots, enhance its powerful analysis capabilities.
Pioneered by Tektronix, the first DPO was introduced in June 1998 as a new approach to signal acquisition.
The DPO architecture dedicates unique ASIC hardware to capture signal data at over 400,000 waveforms per second, giving design engineers an unmatched ability to view signals and circuit behaviour.
Based on an Open Windows platform, this innovative instrument offers unprecedented customisation and extensibility using Windows-compatible hardware and software, including third-party analysis tools.
The TDS7254 DPO provides engineers with advanced test capabilities for verification, debug and characterisation of sophisticated electronic designs.
Classic analogue-style controls, large touch-sensitive display and graphical menus provide intuitive control.
Standard interfaces allow expansion of the TDS7254 to include peripherals such as storage devices, a modem, or a wireless LAN connection.
Once networked, users can share files with team members worldwide, access print resources, reference design data via the Web, and exchange e-mail.
And, using the dual-monitor mode supported by Windows, designers can refer to and exchange this critical information while simultaneously making measurements on any of the TDS7000 Series. Request a free brochure from Tektronix ...
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