Product category:
Level Sensors and Leak Detectors
News Release from: TM Electronics | Subject: Leak testing 301
Edited by the Engineeringtalk Editorial
Team on 23 January 2004
Learn the fundamentals of leak testing
TM Electronics has published third in its series of informational "mini-courses" designed to help design and quality engineers grasp the fundamentals of leak testing.
TM Electronics has published third in its series of informational "mini-courses" designed to help design and quality engineers grasp the fundamentals of leak testing "Leak testing 301: nondestructive pressure decay chamber leak testing" joins the existing titles "Leak and flow testing 101" and "Package testing 201"
This article was originally published on Engineeringtalk on 6 Jun 2006 at 8.00am (UK)
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Specifically oriented toward the nondestructive testing of closed products or nonporous packages that cannot be pressurised, "Leak testing 301" explores the use of pressure or vacuum decay surrogate chamber testing as a highly sensitive, repeatable and efficient test method that can be adapted to a wide variety of testing situations.
These booklets, written by Stephen Franks, are available at no cost from TM Electronics or electronically at their website, from the company's website.
Franks is well known throughout the industry as author of numerous articles and presenter of workshops on various topics in leak science.
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