Report summarises world patent changes
A
Thomson Scientific product story
Edited by the Engineeringtalk editorial team
Apr 7, 2004
The 2004 Thomson Patent Focus Report summarises legislative and infrastructure changes at the Japanese, the US and European patent offices during 2003.
The 2004 Thomson Patent Focus Report summarises legislative and infrastructure changes at the trilateral patent authorities of the Japanese Patent Office (JPO), the US Patent and Trademark Office (USPTO) and the European Patent Office (EPO) during 2003.
The report includes expert commentary from Ron Marchant, Chief Executive of the UK Patent Office, and Bruce Lehman, President and Chief Executive Officer of the International Intellectual Property Institute.
Written by freelance journalist Joff Wild, the complimentary report can be downloaded from IP Matters, the Thomson web-based intellectual property forum.
"Patents are now recognised as pivotal business assets of major economic importance, and patent policy and issues are debated at the highest level", said Rob Willows, Vice President, Patent Office Relationships, Thomson Scientific.
"With summaries of recent legislation, and expert commentary on broad reaching issues such as the European Community patent and the USPTO strategic plan, the Patent Focus Report provides an authoritative summary for those who need to stay on top of key patenting issues".
In addition to the most recently available stats for patent filings worldwide, the review focuses on legislative and infrastructure developments in the European, Japanese, and US patent authorities.
EPO coverage includes extensive discussion of the Community patent plus a focus on software patenting and stem cell patenting legislation.
The JPO section looks at revisions to the official fees schedule for patents and the overhaul of Japan's utility model system.
The USPTO review includes revisions to the Strategic plan, plus discussion on the inauguration of the Nanotechnology Customer Partnership, and the Federal Trade Commission report on patent quality and quantity.
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