Product category:
Form/co-ordinate, optical and vision instrumentation
News Release from: Xpress Precision Engineering | Subject: Gannen-XM
Edited by the Engineeringtalk Editorial
Team on 01 February 2008
Measuring device suits tiny components
Probing forces with the Gannen-XM are in the uN range and the probing system can be delivered with probing tips down to 50um.
Xpress Precision Engineering has released the Gannen-XM, optimised for true 3D measurements on micro components and MEMS "We see a rising demand for 3D measurements on micro components and MEMS", says Ir Bos, Director of Technology for Xpress Precision Engineering
"Lower stiffness, lower replacement costs and smaller tips make the Gannen-XM suitable for these kinds of measurements".
The Gannen-XM is fully compatible with the mounting of the Gannen-XP.
To minimise preparation down-time, a dual setup is recommended.
Probing forces with the Gannen-XM are in the uN range and the probing system can be delivered with probing tips down to 50um.
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