20nm resolution for hardness tester

Zwick introduces universal hardness testing system with a path measurement system and a resolution of 20nm.

Zwick has introduced a universal hardness testing system with a path measurement system and a resolution of 20nm.

The hardness measurement system is equipped with a transmission modification.

On account of its modularity, it is suited for all standard classic hardness methods (indentation, depth measurement and optical testing) as well as instrumented indentation testing (Marten hardness).

A combined testing of the instrumented indentation test with the classical optical methods in a single testing sequence is possible.

The modular design allows implementation in Zwick materials testing machines or in automated test systems.

The system can test high-strength materials such as ceramics and dental materials.

Applications are in the testing of steel, aluminum, plastics and glass as well as materials for the automotive industry.

The machine consists of four components - materials testing machine, hardness measurement head with the high-resolution path measurement system, supplementary optical unit and Zwick Testxpert testing software.

Two hardness measurement heads are available for the load ranges 2 to 200N and 5 to 2500N.

There is automatic evaluation of the test load and indentation depth characteristic for the material characterisation.

The hardness tester is equipped with a measurement microscope with an integrated CCD camera for this purpose.

The test indention is performed by the hardness measurement head, the measurement by the indentation and depth measurement system or subsequent to displacement by the supplementary optical unit.

A compound table program makes multiple sequences possible so batch testing can be performed.

Testxpert is used to operate the hardness tester.

It controls and monitors all functions and allows variable configuration of the test sequence.

The hardness tests are automatically evaluated and documented in a clearly laid out test log.

The configuration of test sequences for specific requirements and multi-purpose result representations are possible as well as the transfer of data to external databases.

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